Force measurements with the atomic force microscope: Technique, interpretation and applications (Q56170640)

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Language	Label	Description	Also known as
English	Force measurements with the atomic force microscope: Technique, interpretation and applications	No description defined

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instance of

scholarly article

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title

Force measurements with the atomic force microscope: Technique, interpretation and applications (English)

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main subject

microscope

1 reference

based on heuristic

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author

Hans-Jürgen Butt

series ordinal

1

object named as

Hans-Jürgen Butt

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Michael Kappl

series ordinal

3

object named as

Michael Kappl

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author name string

Brunero Cappella

series ordinal

2

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publication date

October 2005

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published in

Surface Science Reports

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volume

59

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issue

1-6

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page(s)

1-152

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Identifiers

DOI

10.1016/J.SURFREP.2005.08.003

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